18 Mar 2026
10:45 - 11:15
Expo Theater III
PICs and CPO will deliver higher bandwidths and power efficiencies across AI networks, but ramping manufacturing of these critically important technologies requires new test capabilities. Hear practical strategies for scalable opto-electrical testing from wafer to module and how designing future-ready test systems will enable multi‑channel measurements, faster validation and high‑volume production.
Speaker
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Kees Propstra
Vice President of Product Marketing, Quantifi Photonics, United States
Presented By
