Parametric Measurements and Transceiver Test

Tuesday, 08 June 16:00 – 16:30

Tektronix: Optical communication development is strongly dependent on laser technology.  Tektronix contributes by providing state-of-the-art tools through numerous stages of the value stream / workflows.

In production, Light-Current-Voltage (LIV) measurements are performed to screen for good and bad parts before shipped to customers. Keithley Source Measure Units (SMUs) are the instrument of choice for off- and on-wafer IV and LIV laser measurements. 
Tektronix Sampling Oscilloscopes perform high speed transceiver testing at 26 GBd and 53 GBd, SM and MM with clock recovery while Tektronix Real Time Oscilloscopes perform analysis for electrical and optical anomalies and for rapid collection of waveform statistics.