• Technical Conference:  30 March – 03 April 2025
  • Exhibition: 01 – 03 April 2025
  • Moscone Center, San Francisco, California, USA
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DateSession

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(UTC - 07:00)
Photonics for Fault-Tolerant Quantum Computing (M3A.4)
Mark Thompson PsiQuantum
Invited D1: Advanced Prototyping, Packaging and Integration S1: Datacom Subsystems and Systems

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(UTC - 07:00)
High Efficiency Single-Sideband Modulator Using Coupled Bragg Grating Resonators on Thin-Film Lithium Niobate (M3K.3)
Nuo Chen Zhejiang University
D3: Active Components S3: Transmission Systems

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(UTC - 07:00)
Tbps IM/DD Transmission Over 10 km SMF With O-Band Quantum Dot Laser Comb for DCIs (M3C.3)
Lakshmi Narayanan Venkatasubramani Dublin City University
D3: Active Components S3: Transmission Systems

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(UTC - 07:00)
Non-Destructive Characterization of Hollow Core Fiber (M3J.4)
Leonard Budd University of Southampton
Invited D4: Fibers and Propagation Physics S4: Optical Processing, Microwave Photonics and Fiber-sensing

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(UTC - 07:00)
Reconfigurable Photonics and Flexible AI Systems (M3D.4)
Gregory Steinbrecher Meta Platforms Inc
Invited

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(UTC - 07:00)
Towards Tbps Single-λ Interconnect by a Multimode Integrated Optical I/O on Silicon for Few-Mode Fibers (M3B.2)
Hao CHEN The Hong Kong University of Science and Technology (Guangzhou)
D2: Passive Components S2: Subsystems for Transmission

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(UTC - 07:00)
Thin-Film Lithium Niobate Modulator for a Flat Frequency-Response Over 110 GHz Bandwidth With Integrated Electro-Optic Frequency-Domain Equalizer (M3K.4)
Yuya Yamaguchi NICT
D3: Active Components S3: Transmission Systems

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(UTC - 07:00)
Low Threshold and 10kHz-Class Narrow Linewidth 1.55 um-Band Quantum Dot Laser Diode on InP(311)B Substrate (M3C.4)
Atsushi Matsumoto National Inst of Information & Comm Tech
D3: Active Components S3: Transmission Systems

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(UTC - 07:00)
Experimental Demonstration of Amplifier-Less 82GBaud PAM4 Transmission Over 40 km Using APD at O Band (M3E.4)
Haiqiang Wei Hong Kong Polytechnic University

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(UTC - 07:00)
Monitoring Data Augmentation of Spectral Information Using VAE and GAN for Soft-Failure Identification (M3I.4)
Lars Kruse Christian-Albrechts-Universität zu Kiel