• Technical Conference:  05 – 09 March 2023
  • Exhibition: 07 – 09 March 2023
  • San Diego Convention Center, San Diego, California, USA

SC178 - Test and Measurement for Data Center/Short Reach Communications

Monday, 07 March
08:30 - 12:30 (Pacific Time (US & Canada), UTC - 08:00)

Short Course Level: Beginner


Greg D. Le Cheminant; Keysight Technologies, USA​

This short course will be held in person only at the San Diego Convention Center. Please check your email for information on the location where this short course will be held. If you need assistance please visit the Info Desk by registration.
Short Course Description:

The ability to accurately characterize signals and waveforms is an essential element in the development and manufacturing of high-speed data communications components and systems. This course will emphasize measurement tools and techniques to characterize signal quality and how well it is maintained when transmitted through a data center/short reach optical system. It will focus on three measurement areas: bit-error-ratio (BER) analysis, oscilloscope waveform analysis with emphasis on the NRZ and PAM4 eye diagrams, including TDEC and TDECQ, and a review of jitter analysis. The basics for each measurement type will be covered, gradually building to the more difficult aspects of measurements, including common measurement problems and their solutions. Results from tests performed on actual components and systems using BERTs, oscilloscopes, and network analyzers will be presented. The course will emphasize research and development and manufacturing measurements of components and subsystems and will not discuss installation and maintenance test.

Short Course Benefits:

This course should enable you to:

  • Determine the relationships between BER, eye-diagrams and jitter tests.
  • Avoid common mistakes that degrade measurement accuracy.
  • Define how frequency domain analysis provides insights into time-domain performance.
  • Identify ways to increase test efficiencies.
  • Develop test strategies to verify compliance to industry standards.
  • Correlate test metrics such as TDECQ to system level power budgets
  • Compare the different approaches to characterizing jitter and recognize what the results imply in a systems context.
  • Identify the essential differences between test methods for NRZ and PAM4 signaling formats
Short Course Audience:

This course is appropriate for engineers, technicians and scientists who have a basic or higher knowledge of high-speed communications systems and signals. A basic knowledge of common laboratory measurement instrumentation will be helpful.

Instructor Biography:

Greg LeCheminant holds B.S.E.E.T. (1983) and M.S.E.E. (1984) degrees from Brigham Young University. He began work for Keysight Technologies/Agilent Technologies/Hewlett-Packard in 1985 as a microwave circuits manufacturing development engineer. Since 1989, he has been involved in the development of measurement tools and applications for high-speed digital communications signals and systems with an emphasis in optical transmission. Greg represents Keysight Technologies in IEEE 802.3 Ethernet standards development.