Patrick Lo, Advanced Micro Foundry, Singapore
Ashkan Seyedi, NVIDIA, USA
Wei Shi, Université Laval, Canada
This panel brings together industry leaders to discuss standardization of the PIC at the wafer-level, directly from the foundry. We propose a vision for defining standard test methodologies, data formats, test structures and associated figures of merit to allow for direct comparison of various silicon photonics processes. We also propose a simulation-based design approach based on validated models & process margins for new devices, which intends to accelerate design cycles and reduce spending. As the need for silicon photonics becomes critically important, these capabilities are paramount for the industry to achieve critical mass. Join the leaders from foundries, test & measurement vendors, EPDA companies and silicon photonics vendors to hear the vision, to ask questions and to voice your opinion on how we as a community can move towards standardized PIC testing.