Wafer Scale TFLN Platform Exhibiting 0.1 dB/cm Single Mode Propagation Loss (W2A.1)
Presenter: Bingzhou Hong, Zhangjiang Lab
Wafer scale thin film lithium niobate platform was demonstrated based on deep ultraviolet photolithography. The average single mode propagation loss is 0.23 dB/cm at 1550 nm with standard deviation of 0.07 dB/cm. A 0.1 dB/cm level single mode propagation loss was measured at 1576 nm.
Authors:Liming Lv, Zhangjiang Lab / Bingzhou Hong, Zhangjiang Lab / Shaobo Fang, School of Information Science and Technology,Fudan University / Ruoyu Shen, School of Information Science and Technology,Fudan University / Yunkai Yu, School of Information Science and Technology,Fudan University / Ying Wang, Zhangjiang Lab / Yue Zhou, Zhangjiang Lab / Haiwen Cai, Zhangjiang Lab / Wei Chu, Zhangjiang Lab