• Technical Conference:  30 March – 03 April 2025
  • Exhibition: 01 – 03 April 2025
  • Moscone Center, San Francisco, California, USA
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Poster / Demo

Wafer Scale TFLN Platform Exhibiting 0.1 dB/cm Single Mode Propagation Loss (W2A.1)

Presenter: Bingzhou Hong, Zhangjiang Lab

Wafer scale thin film lithium niobate platform was demonstrated based on deep ultraviolet photolithography. The average single mode propagation loss is 0.23 dB/cm at 1550 nm with standard deviation of 0.07 dB/cm. A 0.1 dB/cm level single mode propagation loss was measured at 1576 nm.

Authors:Liming Lv, Zhangjiang Lab / Bingzhou Hong, Zhangjiang Lab / Shaobo Fang, School of Information Science and Technology,Fudan University / Ruoyu Shen, School of Information Science and Technology,Fudan University / Yunkai Yu, School of Information Science and Technology,Fudan University / Ying Wang, Zhangjiang Lab / Yue Zhou, Zhangjiang Lab / Haiwen Cai, Zhangjiang Lab / Wei Chu, Zhangjiang Lab


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