Lifetime Model for Enabling Reliable InGaAs/GaAs Nano-Ridge Lasers Monolithically Integrated on 300 mm Silicon (W2A.22)
Presenter: Ping-Yi Hsieh, KU Leuven
A lifetime model is presented to study the diffusion-driven gradual degradation and the recombination-enhanced rapid failure in monolithic InGaAs/GaAs-on-Si nano-ridge lasers induced by high current density at p-contacts. Design guidelines are provided for improving reliability.
Authors:Ping-Yi Hsieh, KU Leuven / Artemisia Tsiara, IMEC / Barry O'Sullivan, IMEC / Sara El Akel, Grenoble INP - Phelma / Huseyin Sar, IMEC / Debi Panda, IMEC / Peter Swekis, IMEC / Didit Yudistira, IMEC / Bernardette Kunert, IMEC / Joris Van Campenhout, IMEC / Ingrid De Wolf, KU Leuven