Live Demonstration of ML-Based PON Characterization and Monitoring (M3Z.7)
Presenter: Maximilian Brügge, ADVA Optical Networking SE
We demonstrate a machine learning-based solution for optical time-domain reflectometry devices which can assist in the classification and monitoring of reflective events in a passive optical network.
Authors:Maximilian Brügge, ADVA Optical Networking SE / Jasper Müller, ADVA Optical Networking SE / Sai Kireet Patri, ADVA Optical Networking SE / Sander Jansen, ADVA Optical Networking SE / Jim Zou, ADVA Optical Networking SE / Stephanie Althoff, Technical University of Dortmund / Klaus-Tycho Förster, Technical University of Dortmund