Optical Damage Threshold Screening Methodology for 28 GBd, Long Wavelength Avalanche Photodiodes (Th2A.39)
Presenter: Hektor Meier, Albis Optoelectronics AG
We present a novel scalable wafer screening method that guarantees an optical damage threshold larger than +5 dBm for 28 GBd long wavelength avalanche photodiodes over large-scale production volumes.
Authors:Alberto Ciarrocchi, Albis Optoelectronics AG / Wei Quan, Albis Optoelectronics AG / Markus Blaser, Albis Optoelectronics AG / Maria Hämmerli, Albis Optoelectronics AG / Hektor Meier, Albis Optoelectronics AG