• Technical Conference:  05 – 09 March 2023
  • Exhibition: 07 – 09 March 2023
  • San Diego Convention Center, San Diego, California, USA
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Poster

Optical Damage Threshold Screening Methodology for 28 GBd, Long Wavelength Avalanche Photodiodes (Th2A.39)

Presenter: Hektor Meier, Albis Optoelectronics AG

We present a novel scalable wafer screening method that guarantees an optical damage threshold larger than +5 dBm for 28 GBd long wavelength avalanche photodiodes over large-scale production volumes.

Authors:Alberto Ciarrocchi, Albis Optoelectronics AG / Wei Quan, Albis Optoelectronics AG / Markus Blaser, Albis Optoelectronics AG / Maria Hämmerli, Albis Optoelectronics AG / Hektor Meier, Albis Optoelectronics AG


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