SmarTest LLC Announces 14.5 Gb/s Programmable Pattern Generators and Bit Error Rate Test instruments

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Technical Conference: 30 March – 03 April 2025
Exhibition: 01 – 03 April 2025
Moscone Center, San Francisco, California, USA

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PRESS RELEASE

11 March 2014

SmarTest LLC Announces 14.5 Gb/s Programmable Pattern Generators and Bit Error Rate Test instruments for Fastest Time-to-Test Results

SmarTest LLC announces four new innovative test & measurement products targeting high-speed optical transceiver R&D and manufacturing markets including single and four-channel 14.5 Gb/s Programmable Pattern Generators and equivalent channel count Programmable Bit Error Rate Testers the size of a hard-backed book.

Information at www.SmarTest.us.com

Visit booth 3388 OFC 2014, to experience a live product demonstration.