The Optical Networking and Communication
Conference & Exhibition

Los Angeles Convention Center,
Los Angeles, California, USA

Burn-in test Socket for QFN74 with exposed pad


31 January 2015

Vinayak Panavala
1335 Eagandale Court
Eagan, MN 55121

Tel: 952-229-8200 or (800) 404-0204
Fax: 952-229-8201

Burn-in test Socket for QFN74 with exposed pad

Socket and Test your 4.5x12.5mm QFN74 device using extreme temperature socket

EAGAN, MN - January, 2015 - Ironwood Electronics recently introduced a new Stamped spring pin socket addressing burn-in test requirements for testing 74 lead QFN - CBT-QFN-7038. The contactor used in CBT-QFN-7038 socket is a stamped spring pin with 15 gram actuation force per ball and cycle life of 10,000+ insertions. The self inductance of the contactor is 0.98 nH, insertion loss < 1 dB at 10 GHz and capacitance 0.03pF. The current capacity of each contactor is 2.2 amps. Socket temperature range is -55C to +155C. Socket also features a clamshell lid for easy chip insertion and removal. It has a wave spring with swivel compression plate for vertical force without distorting device position. The specific configuration of the package to be tested in the CBT-QFN-7038 is a QFN, 4.5x12.5mm, 0.4mm pitch, 74 peripheral positions with additional 6x3 array of pins for center ground pad. The socket is mounted using supplied hardware on the target PCB with no soldering, and uses the smallest footprint in the industry. The smallest footprint allows inductors, resistors and decoupling capacitors to be placed very close to the device for impedance tuning. To use, place QFN device into the socket and close the lid by snapping to the latch. This socket can be used for quick device screening, device characterization at extreme temperatures as well as for production burn-in test.

Pricing for the CBT-QFN-7038 is $603 at qty 1 with reduced pricing available depending on quantity required.

Sponsored by: